SEMs are Fully Automated

HORIBA Scientific has 4 new detectors in its CLUE Series for Scanning Electron Microscopes (SEM) and dual SEM/Focused Ion Beam (FIB) microscopes. The CLUE (Cathodo-Luminescence Universal Extension) series is designed for use in materials science, mineralogy, geology, life sciences and forensics applications. They interface with any SEM, are fully automated, modular for easy upgrade and offer the widest spectral range available (UV-Vis-IR).

The new CLUE Series includes 4 models:

· I-CLUE fast Cathodo-Luminescence (CL) imaging system offers a large field of view ellipsoidal collection mirror. i-CLUE is field upgradeable to a complete spectroscopy solution, offering high sensitivity CL detection.

· F-CLUE rugged imaging and hyperspectral CL solution is an easy upgrade on existing configurations. With its ultra-compact design inside (fully retractable mirror collection) and outside the specimen chamber and its fiber coupled spectrometer fits every customer having a microscope with a free horizontal port.

· H-CLUE imaging and hyperspectral CL solution features the best performance in the market by combining a high quality parabolic mirror for DUV-VIS-NIR, direct optical coupling, and high resolution spectrometer.

· R-CLUE combines HORIBA expertise in Cathodoluminescence, Raman spectroscopy and Photoluminescence within one compact fiber coupled solution.

SEM-CL helps discover the nature of defects, structures, stress at the nanoscale (<20nm spatial resolution), making it the ideal tool for novel nanomaterials characterization.