Add to favorites

#Product Trends

AA2000 Atomic Force Microscope

Atomic Force Microscope

Atomic Force Microscope (AFM)

Lateral Force Microscope (LFM)

Force Analysis: I-V Curve, I-Z Curve, Force Curve

Online real-time 3D image for better observation

Multi-channel signals for more sample details

Trace-Retrace scan, Back-Forward scan

Multi-Analysis: Granularity and Roughness

Data load-out for further analysis

Details

  • 95 Mill St, Stoughton, MA 02072, USA
  • Angstrom Advanced Inc

    Keywords