Bruker Introduces MultiMode 8-HR AFM for Nanoscale Research

Extensive New Capabilities for the World’s Most Successful Atomic Force Microscope Platform

SANTA BARBARA, California – January 12, 2016 – Bruker’s Nano Surfaces Division today announced the release of the MultiMode 8-HR Atomic Force Microscope (AFM), which brings extensive new capabilities for nanomechanics and higher speed imaging to the world’s highest resolution, most widely-used and field-proven scanning probe microscope (SPM). The new nanomechanics features of MultiMode 8-HR enable researchers to access the broadest range of ramp frequencies for viscoelastic studies and nanomechanical assessment of a wide range of materials, from soft biological specimens to hard metallic samples.

“The MultiMode® platform has long been the gold standard for performance and application versatility, and we’ve significantly enhanced its capabilities with the MultiMode 8-HR,” commented Stephen Minne, Ph.D., Vice President and General Manager of Bruker’s AFM Business. “Unique improvements include higher speeds, higher resolution imaging, new capabilities in nanomechanics with enhanced PeakForce QNM®, and new FastForce Volume™ modes. In keeping with our ongoing commitment to our thousands of loyal MultiMode customers, we have designed these new developments in resolution, flexibility, and reliability to be available also as upgrades to their current MultiMode systems.”

About MultiMode 8-HR

The high-resolution and data processing capabilities of the MultiMode 8-HR are the result of its combination of rigid, mechanical design and extremely advanced control electronics. Utilizing Bruker’s NanoScope® V Controller and new Version 8.2 software, the system features unprecedented bandwidth and extremely low-noise data acquisition to enable such proprietary technology advances as ScanAsyst®, Peak Force QNM and FastForce Volume. These features combine to reaffirm the MultiMode 8-HR as the most versatile, highest performance AFM in its class.