Diffraction System Combines Flexibility, Ease-of-use

Bruker’s D8 AVANCE Plus is designed to investigate epitaxial and polycrystalline thin films, large and oddly shaped bulk specimens, as well as micro- to macro-amounts of powder samples under ambient and non-ambient conditions.

The new TRIO optic is the key component, combining the three most commonly used X-ray diffraction geometries in one single optic: divergent beam for X-Ray Powder Diffraction (XRPD), high intensity parallel beam for capillary experiments, height insensitive measurements, surface sensitive grazing incidence geometry, coating thickness determination and micro-diffraction, and pure Cu-Ka1 parallel beam for High-Resolution X- Ray Diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples. The optic features motorized switching between the three geometries and fully software–controlled instrument alignment, SmartCalib.