AFM Boasts Intelligent Operation Features

From surface topography to a variety of nanoscale surface property measurements, Hitachi’s portfolio of SPM products offers enhanced levels of performance and ease-of-use.

The Hitachi AFM5100N uses a self-detecting cantilever, eliminating the need for tedious laser alignment. Proprietary intelligent scanning (SIS) provides enhanced data accuracy. Seamless operation via auto measurement features include high-speed Q-curve, auto-approach and parameter optimization, offering true point-and-click results for sample topography and phase imaging. The AFM5300E is a user-friendly research-grade environmental control SPM that supports a variety of in-situ observations and measurement conditions, including high vacuum and liquids. The Integrated vacuum system enables cryogenic analyses and high-resolution imaging of electromagnetic properties. Convenient SPM air protection holders are compatible with both proprietary ion milling systems and SEMs.