Platform Combines AFM, Optical Tweezers

JPK Instruments’ OT-AFM Combi-System combines atomic force microscopy and optical tweezers in a single inverted light microscope platform.

The system pairs the excellent surface force measurement and imaging capabilities of AFM with the ability of optical tweezers to apply and measure the smallest forces in 3-D. The combination of 3-D positioning, detection and manipulation provided by OT and the high-resolution imaging and surface property characterization of AFM opens up a spectrum of applications. For example, cellular response, cell-cell or cell matrix interactions, immune response, infection or bacterial/virus/nanoparticle uptake processes are just some of the applications that can be investigated with the OT-AFM platform.