New Field Emission Scanning Electron Microscope

ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450, which combines ultrahigh resolution imaging with the capability to perform enhanced analytics while maintaining flexibility and ease-of-use.

With this device, users benefit from high resolution, surface sensitive imaging and an optical system that ideally supports them in obtaining the best analytical results—especially when working with low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low voltage X-ray spectroscopy (EDS) deliver excellent results due to instrument's ability to precisely and independently control spot size and beam current. With the new design, it is possible to always work under optimized conditions as the user can switch seamlessly between imaging and analytical modes at the touch of a button.