Posted on 8/20/2019
ZEISS introduces new capabilities for ZEISS ion beam microscopes, which cover advancements in analytics, tomography, sample preparation, and data integrity. This brings new possibilities in engineering materials, energy materials, soft materials, and geosciences covering megatrends in additive manufacturing, battery and photovoltaic research, building materials, and nanomaterials.
Analytics
Introducing SIMS solutions for elemental analysis across the ZEISS Crossbeam family adds a significant analytical capability to ZEISS ion beam microscopes. This is complemented with the new Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) detection introduced for the latest member of the ZEISS Crossbeam family, ZEISS Crossbeam 350, as well as on ZEISS...